Abstract
The effects of SO 4 2− ion concentrations on the phase evolution of electrochemical deposited films have been investigated using scanning electron microscopy (SEM), energy-dispersive X-ray (EDX), X-ray diffraction (XRD) and Fourier transform infrared spectroscopy (FTIR). The results show that SO 4 2− ion concentration plays a very important role in directing the phase evolution of thick films from rod-like ZnO to plate-like zinc hydroxysulfate under fast hydroxylation. When ZnSO 4 concentrations are below 0.54 mM, the oriented growth of ZnO rods tends to be enhanced with the increase of ZnSO 4 concentration. Otherwise, the vertically aligned zinc hydroxysulfate plates can be formed by the introduction of SO 4 2− ions in nanocrystals.
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