Abstract
When the phase distribution is evaluated in temporal speckle pattern interferometry by means of the Hilbert transform method, the accuracy of the estimation is conditioned by the influence of the variations of the bias and the modulation intensities, since these parameters must be selected heuristically. In this work we present a novel approach that uses the Empirical Mode Decomposition (EMD) method in order to overcome the previous problem. To illustrate the improvement obtained with the proposed method, an example of its application is presented.
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