Abstract

Automated backscatter Kikuchi diffraction in the SEM enables rapid discrimination of phases and the automated acquisition of phase-distribution maps at sub-micron resolution, if the phases belong to different Laue groups and/or if their lattice constants are significantly different. The acquired database can be further used for quantitative determination of phase contents, for construction of crystal orientation maps, for characterization of grain and phase boundaries, for crystal texture analysis on a grain-specific level by calculating pole figures and orientation density functions separately for each phase, and for orientation stereology in general. Pattern-quality maps provide a clear reproduction of the microstructure on a meso-scale level.

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