Abstract

The phase composition of Li1?xHxNbO3 and Li1?xHxTaO3 waveguide layers produced ?t different modifications of the proton exchange (PE) technology and having complex phase composition with different quota of the phases present is analyzed based on their mode and IR spectra. The intrinsic stress caused by crystal lattice deformations at a relatively high level of hydrogen doping in the PE layers is estimated by the optical integral method. An attempt to explain the level of stress is made based on the phase composition of the studied samples. The results contribute to a better understanding of the properties and characteristics of such waveguides.

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