Perpendicularly magnetized (001)-textured D22 MnGa films grown on an (Mg0.2Ti0.8)O buffer with thermally oxidized Si substrates

Abstract

We report the growth of (001)-textured polycrystalline D022 MnGa films with perpendicular magnetic anisotropy (PMA) on thermally oxidized Si substrates using an (Mg0.2Ti0.8)O (MTO) buffer layer. The ordered D022 MnGa film grown at the optimum substrate temperature of 530 °C on the MTO buffer layer shows PMA with magnetization of 80 kA/m, PMA energy density of 0.28 MJ/m3, and coercivity of 2.3 T. The scanning transmission electron microscope analysis confirms the formation of a highly (001)-textured structure and the elementally sharp interfaces between the MTO layer and the MnGa layer. The achieved D022 MnGa PMA films on an amorphous substrate will provide the possible pathway of integration of a Mn-based PMA film into Si-based substrates.