Abstract
Thin films consisting of two-phase PtMnSb and Mn2Sb were prepared by thermal annealing of ion-beam sputtered Pt/Mn/Sb multilayers having four different types of stacking patterns. The resulting phase morphologies such as preferred orientations and relative amounts of the constituting phases were greatly affected by the initial stacking patterns of the multilayers and annealing conditions. The magnetic measurements revealed that the perpendicular magnetic anisotropy was developed in the samples with the c-axis preferred orientation of the Mn2Sb phase.
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