Abstract
We used broadband ferromagnetic resonance (FMR) spectroscopy to measure the second- and fourth-order perpendicular magnetic anisotropies in Ta/(t) Co <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">60</sub> Fe <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">20</sub> B <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">20</sub> /MgO layers over a Co <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">60</sub> Fe <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">20</sub> B <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">20</sub> thickness range of 5.0 nm ≥ t ≥ 0.8 nm. Fort > 1.0 nm, the easy axis is in the plane of the film, but when t <; 1.0 nm, the easy axis is directed perpendicular to the surface. However, the presence of a substantial higher order perpendicular anisotropy results in an easy cone state when t = 1.0 nm. Angular-dependent FMR measurements verify the presence of the easy cone state. Measurement of the spectroscopic g-factor via FMR for both the in-plane and out-of-plane geometries suggests a significant change in electronic and/or physical structure at t ≈ 1.0 nm thickness.
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