Abstract
The electrical resistivity and the temperature coefficient of the resistance (TCR) of Cu/Mn multilayer films have been studied in the temperature range 28–303 K. Two sets of films are investigated, one with a constant number of double layers and increasing bilayer wavelength (Λ) in the range 4–12 nm, and the other with constant Λ and varying number of double layers ( n) in the range 5–30. The bilayer wavelength dependence of the room temperature resistivity (ρ RT) and the TCR exhibit an oscillatory behaviour.
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