Abstract
In order to explain the mechanism of the perpendicular coercivity of Co-Cr films, a new model of the microstress distribution has been established based on the structure observed elsewhere. The microstrain measured by an X-ray diffraction technique, the Warren-Averbach method, is considered to contribute to the perpendicular coercivity through the magnetostrictive effect upon magnetic wall displacement; then a relationship between the perpendicular coercivity and the microstrain is induced. The theoretical results are compared with experimental values of the perpendicular coercivity. In addition, the mechanism of the magnetization reversal is discussed.
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