Abstract
The need for wireless sensing technology has rapidly increased recently, specifically the usage of electromagnetic waves which becoming more required as a source of information. Silicon carbide (SiC) Nano particles has been used in this study, the material under test (MUT) was exposed directly to a microwave field to examine the electromagnetic behavior. The permittivity and permeability were investigated with different filler materials to approach best and optimal electromagnetic absorbing characteristics to assist engineers to monitor structure-based composite for defects evaluation that may occur during operation conditions or through manufacturing process. XRD, FESEM and both complex permittivity and permeability were measured for the pure materials that candidate for this study. The results showed that all the selected nanostructure material exhibit a good purity with proper electromagnetic properties in the X- band, this can lead to absorbing and transmission properties that can be used in monitoring structures or manufactured part during fabrication process.
Highlights
Electromagnetic (EM) waves have involved in many sectors of daily life and industry, due to its unique properties that can provide a variety of information for a particular object
Fe2O3 nanoparticles which milled in ball milling for four hours were shown in Fig. 1(b), the shape of particles seems like nano rods with size of about 100-300 nm due to the milling process, these particles indicate high surface area which is beneficial for EM absorbing properties
The characterizations of the selected materials were investigated in terms of (FESEM, XRD, XPS and microwave absorbing capability)
Summary
Electromagnetic (EM) waves have involved in many sectors of daily life and industry, due to its unique properties that can provide a variety of information for a particular object. In the materials field EM took a considerable place of providing information to the manufacturer about the status of the product that met the requirement of quality or it may needs more enhancement to reach the optimal performance [1]. This wave (EM) is considered as one of the most important sources of information in the field of nondestructive testing, for its reliability and confident of result or measurement for the materials or product parts during the procedure of manufacturing. Due to its semiconductor properties, it can be used in microelectronic devices and in nuclear industry as one of the most important structural ceramic [2, 5]
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