Periodic and traveling current-density distributions in high-voltage diodes caused by avalanche injection

Abstract

Fast switching of high-voltage diodes from the forward-conducting state to the blocking state may result in avalanche injection at diode voltages far below the static breakdown voltage, when the concentration of free charge carriers in the space charge region exceeds the doping concentration. Under such conditions, the current-density may become non-uniform. Our numerical investigations on 3.3-kV and 13-kV diodes show that-depending on the turn-off conditions-diverse current-density patterns may arise. Two completely different types of periodic current-density distributions that may appear in high-power diodes during the reverse recovery period are investigated in detail by means of numerical calculations. Furthermore, the influence of the charge carrier lifetime and thermal effects on the evolution of the current-density patterns emerging from the periodic current-density distribution is discussed