Abstract

This work reports on the improved performance of planar GaAs and InGaAs Schottky diodes fabricated by rare element Pr related oxides Pr 2O 3-added liquid phase epitaxy. We verify that impurity concentrations are suppressed by two orders, and that electron mobility is significantly enhanced. With Pr 2O 3 added, the cutoff frequency of Schottky diodes increases in planar InGaAs but decreases in planar GaAs, because of higher contact resistance.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.