Abstract
The system analysed is a two-unit gracefully degrading system with repair. After each repair, the unit is tested to see if the repair meets certain predefined specifications. If it does, the unit is put to operation, otherwise it goes to post-repair. The failure-time and testing-time distributions are exponential whereas all other distributions are arbitrary. The technique of embedded SMP is employed to obtain several system performance parameters, namely, MTFF (mean time to first failure), availability, computational availability, expected number of visits to a certain state etc.
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