Performance Optimization and Toxicity Effects of the Electrochemical Oxidation of Octogen

Abstract

Octogen (HMX) is widely used as a high explosive and constituent in plastic explosives, nuclear devices, and rocket fuel. The direct discharge of wastewater generated during HMX production threatens the environment. In this study, we used the electrochemical oxidation (EO) method with a PbO2-based anode to treat HMX wastewater and investigated its degradation performance, mechanism, and toxicity evolution under different conditions. The results showed that HMX treated by EO could achieve a removal efficiency of 81.2% within 180 min at a current density of 70 mA/cm2, Na2SO4 concentration of 0.25 mol/L, interelectrode distance of 1.0 cm, and pH of 5.0. The degradation followed pseudo-first-order kinetics (R2 > 0.93). The degradation pathways of HMX in the EO system have been proposed, including cathode reduction and indirect oxidation by •OH radicals. The molecular toxicity level (expressed as the transcriptional effect level index) of HMX wastewater first increased to 1.81 and then decreased to a non-toxic level during the degradation process. Protein and oxidative stress were the dominant stress categories, possibly because of the intermediates that evolved during HMX degradation. This study provides new insights into the electrochemical degradation mechanisms and molecular-level toxicity evolution during HMX degradation. It also serves as initial evidence for the potential of the EO-enabled method as an alternative for explosive wastewater treatment with high removal performance, low cost, and low environmental impact.