Performance of an extended dynamic range time delay integration charge coupled device (XDR TDI CCD) for high-intrascene dynamic range scanning

Abstract

Many applications, such as industrial inspection and overhead reconnaissance benefit from line scanning architectures where time delay integration (TDI) significantly improves sensitivity. CCDs are particularly well suited to the TDI architecture since charge is transferred virtually noiselessly down the column. Sarnoff's TDI CCDs have demonstrated extremely high speeds where a 7200 x 64, 8 um pixel device with 120 output ports demonstrated a vertical line transfer rate greater than 800 kHz. The most recent addition to Sarnoff's TDI technology is the implementation of extended dynamic range (XDR) in high speed, back illuminated TDI CCDs. The optical, intrascene dynamic range can be adjusted in the design of the imager with measured dynamic ranges exceeding 2,000,000:1 with no degradation in low light performance. The device provides a piecewise linear response to light where multiple slopes and break points can be set during the CCD design. A description of the device architecture and measured results from fabricated XDR TDI CCDs are presented.