Abstract
A Kretschmann-Raether prism-based three-layer structure consisting of a prism, gold (Au) metal film, and dielectric sample has been investigated with the use of admittance loci method in attenuated total internal reflection mode. High index prism materials like silicon, chalcogenide (2S2G), and SF14 have been used to study their effect on surface plasmon resonance (SPR) sensing (at 1200-nm wavelength) in infrared region by corresponding admittance loci plots and also by SPR sensing curves. The performance of the sensor based on the choice of the prism material has been discussed with the help of sensitivity plots giving due importance to the dynamic range of the designed sensor.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
