Abstract
We have been developing a new instrument for high resolution EELS with a spacial resolution of 100nm, a momentum resolution of 0.02A-1 and an energy resolution of 10meV. It is composed of a JEM-1200EX electron microscope - the basic component - , a field emission gun and two Wien filters ( an energy- monochrometer and analyzer) with a retardation lens and an acceleration lens.The shape of the Wien filter was designed to produce the Wien condition E=v × B (E:electric field, B:magnetic field, v:velocity of electrons ) not only in the filter but also in the fringing field regions and to form a stigmatic focus. We reported a preliminary result on energy-loss spectra of Aluminum obtained by using only the analyzer at two different retarding potentials of Uo=2000V and 600V. We believed that the result was taken at the stigmatic focus condition, though we could not understand the reason why such spectra were not obtained at Uo < 600V.
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Schedule a callMore From: Proceedings, annual meeting, Electron Microscopy Society of America
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