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Abstract
To address the reduction in the detection efficiency of a structured CsI(Tl) scintillation screen when its structure period reaches the order of microns, a dual-periodic structure of the screen is proposed. The special feature of the dual structure is that each unit of the primary structure is divided equally into either four or nine square column-shaped scintillation sub-units. The sub-units are separated only by SiO2 layers to form a secondary structure. The results show that the performance of a dual-structure CsI(Tl) screen in X-ray imaging is much better than that of a corresponding single-structure screen.
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