Performance improvement of GaN-based vertical cavity surface emitting laser by employing a hole storage layer and enhancing the carrier transport behavior

Abstract

In this paper, the transport behavior of carriers between multiple quantum wells (vertical) and inside a single quantum well (radial) in a GaN-based Vertical Cavity Surface Emitting Laser (VCSEL) is investigated, and a new device structure with a hole storage layer is proposed to enhance the laser performance. The theoretical results indicate that the vertical transport capability of holes is the key factor for total stimulated recombination rate and hole leakage. The VCSEL with a double-QW structure exhibits better output performance compared to the devices with three or more QWs owing to the lower light absorption loss and the stronger optical field in the active region. Furthermore, a thicker undoped GaN layer is proposed to be added as the hole storage layer to mitigate hole leakage for the VCSEL with a double-QW structure. This new structure can increase the tilt of energy band in the region of the hole storage layer and effectively improve the uniformity of radial distribution of holes in QWs. Therefore, it is beneficial to reduce the threshold current and enhance the laser output power.