Abstract

Low dark current organic photodetectors (OPDs) with a conventional structure consisting of poly(3-hexylthiophene) and [6,6]-phenyl-C61-butyric acid methyl ester (PCBM) as active layer have been fabricated by spray-coating. Tuning the thickness of active layer and thermal annealing process for the spray-coated OPDs results in a remarkable performance with a low dark current density ( Jd) of 2.90 × 10-8 A/cm2 at reverse bias of 1 V. The impact of thermal annealing on the performance of sprayed OPDs is also investigated by the impedance analysis for mechanistic understanding. Our results demonstrate that the optimization of PCBM cluster and interfacial contact between the active layer and the metal electrode tailored by thermal annealing, respectively, could effectively reduce the Jd and increase the sensitivity of sprayed OPDs. The control of PCBM cluster is more important than the interfacial contact between the layers for improving Jd. In addition, structural characterization of the active layer studied by synchrotron small-angle X-ray scattering technique reveals why the spray-coated process can achieve the lowest dark current due to the favorable structure.

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