Abstract

Iterative learning control (ILC) has been widely used in industrial applications. However, there are two critical assumptions that limit the use of ILC: a) no non-repetitive disturbance is present; and b) the trajectory needs to be the same every iteration. This paper proposes a control scheme based on the combination of ILC and disturbance observer (DOB) to relax these assumptions. First, the use of DOB attenuates the effects of non-repetitive disturbance on ILC systems. Second, the proposed control scheme can decouple tracking error into two parts: tracking error due to disturbances and tracking error due to a trajectory. The decoupled tracking error then is utilized to properly initialize the ILC for a new trajectory so as to speed up the convergence rate. Simulation results and experimental results of a prototype wafer scanner system demonstrate the effectiveness of the proposed control scheme.

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