Abstract
The maximum tolerable clock jitter for high-speed ADCs is pessimistically predicted by Nyquist-rate input sinusoidal tests. We prove that the jitter can be greatly relaxed in the presence of lossy channels in wireline systems. We derive compact expressions that allow PLL designers to decide how much jitter can be tolerated for a given channel loss and symbol rate.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have