Abstract

When designing micro-scale tactile probes, a design trade-off must be made between the stiffness and flexibility of the probing element. The probe must be flexible enough to ensure sensitive parts are not damaged during contact, but it must be stiff enough to overcome attractive surface forces, ensure it is not excessively fragile, easily damaged or sensitive to inertial loads. To address the need for a probing element that is both flexible and stiff, a novel micro-scale tactile probe has been designed and tested that makes use of an active suspension structure. The suspension structure is used to modulate the probe stiffness as required to ensure optimal stiffness conditions for each phase of the measurement process. In this paper, a novel control system is presented that monitors and controls stiffness, allowing two probe stiffness values (“stiff” and “flexible”) to be defined and switched between. During switching, the stylus tip undergoes a displacement of approximately 18 µm, however, the control system is able ensure a consistent flexible mode tip deflection to within 12 nm in the vertical axis. The overall uncertainty for three-dimensional displacement measurements using the probing system is estimated to be 58 nm, which demonstrates the potential of this innovative variable stiffness micro-scale probe system.

Highlights

  • Micro-scale coordinate measuring machines make it possible to measure micro-scale features on parts that are small, intricate and fragile

  • Due to the small stylus tip size required by micro-scale probing systems, which can range in diameter from tens of micrometres to a few hundred micrometres [4], probe tip contact forces must be kept low

  • To provide additional environmental stability, the actuators and probing system were housed within a foam enclosure

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Summary

Introduction

Micro-scale coordinate measuring machines (micro-CMMs) make it possible to measure micro-scale features on parts that are small, intricate and fragile. Micro-CMMs can demonstrate very high accuracies, with volumetric uncertainty levels of a few hundred nanometres or less [1,2]. Micro-CMMs employ a high accuracy probing system, which is specially designed for measuring small and delicate parts. Due to the small stylus tip size required by micro-scale probing systems, which can range in diameter from tens of micrometres to a few hundred micrometres [4], probe tip contact forces must be kept low To achieve low contact forces, micro-probes are designed to incorporate highly compliant suspension structures, onto which the stylus system can be mounted (for example, see [7,8,9]). Surface attraction forces exerted on the stylus tip, when contact is made, can cause significant issues [10]. If a probe is made too flexible, the Sensors 2016, 16, 492; doi:10.3390/s16040492 www.mdpi.com/journal/sensors

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