Abstract
In this paper, a technique is presented that will produce a 100% coverage when testing an n-bit analog-to-digital flash converter. This technique is based on the pseudorandom test. An m-bit autonomous linear feedback shift register (ALFSR) is used to generate the test values. A general formula is derived that relates the number of bits in the Flash Converter's output, the number of bits in the ALFSR and the uncertainty in the analog test values. The maximum allowable level of uncertainty is also obtained, in order to guarantee a perfect coverage.
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