Abstract
The (0001) surface morphology of Bi2Te3〈M〉 (M = Cu, Ni) layered crystals has been studied using atomic force microscopy (AFM) and scanning electron microscopy. Two- and three-dimensional AFM images reveal charge transport paths through inhomogeneities created by nanostructured elements (5–20 nm) in the Te(1)-Te(1) interlayer spaces. The nanoparticle distribution in the (0001) plane is similar to the arrangement of model two-dimensional percolation clusters on a square lattice. The carrier mobility in Bi2Te3〈0.5 wt % Ni〉 crystals varies anomalously between 80 and 120 K.
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