Abstract
We fabricated (001)-oriented epitaxial four-layered thin films of Cr/Co2MnSi/Cu/Co50Fe50 by dc magnetron sputtering in order to investigate the physical characteristics of the transverse spin current. The penetration depth λT characterizes the transverse spin current generated by the spin pumping effect that takes place in a film subjected to an external magnetic field. By analyzing the dependence on the Co50Fe50 thickness of the peak-to-peak line widths of ferromagnetic resonance, we determined λT within the Co50Fe50 layer and found it to be λT=0.9nm.
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