Penetration depth measurement in high quality thin films

Abstract

The parallel plate resonator method has been used for measuring high quality \(\) (YBCO) thin films, which have low temperature residual losses comparable to those previously obtained in single crystals. The surface resistance and the real part of the conductivity show a non-monotonic behaviour with a broad peak around 45 K. The penetration depth and the real part of the conductivity vary linearly at low temperatures. The lowest penetration depth linear fitting has a slope value of \(\) to \(\) up to 20 K which is lower than previous measurements on YBCO single crystals. An interpretation of this smaller slope in terms of the generally accepted d-wave order parameter symmetry presents difficulties.