Abstract
A quantitative analysis method for monitoring liquid penetration into nanosize thin layer samples was developed using neutron reflectivity (NR). In this study, we synthesized a partly deuterated ionic liquid (IL) and studied its penetration behavior in perhydropolysilazane-derived silica (PDS) thin layers using NR. The penetration depth of the deuterated IL was estimated to be 184 Å for the 24 h IL-submerged sample and 410 Å for the 72 h IL-submerged sample. In addition, using the obtained penetration depth, an apparent penetration rate constant (kapp) of 0.024 h−1 was evaluated. Thus liquid penetration behavior in PDS thin layer samples can be quantitatively discussed by evaluation of kapp using NR analysis.
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