Abstract

PEAXIS (Photo Electron Analysis and resonant X-ray Inelastic Spectroscopy) is a dedicated endstation installed at the beamline U41-PEAXIS that offers high resolution soft X-ray spectroscopy measurements with incident photon energies ranging from 180 – 1600 eV. The endstation combines two X-ray spectroscopic techniques, X-ray photoelectron spectroscopy (XPS) and resonant inelastic soft X-ray scattering (RIXS), which are important for probing the electronic structure and local and collective excitations of solid-state materials. It features a continuous variation of scattering angle under UHV conditions for wave vector-resolved studies and a modular sample environment that allows investigation in the temperature range between 10 K and 1000 K.

Highlights

  • The electronic structure and dynamics of materials determine their fundamental and functional properties which are relevant for technological applications

  • The instrument is designed for studying solid-state materials by Resonant Inelastic X-ray Scattering (RIXS) and X-ray Photoelectron Spectroscopy (XPS) and, in addition, allows for the investigation of liquids encapsulated in a sealed

  • The xed endstation is installed at the beamline U41-PEAXIS of BESSY II providing monochromatic, linearly polarized light

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Summary

Introduction

The electronic structure and dynamics of materials determine their fundamental and functional properties which are relevant for technological applications. The instrument is designed for studying solid-state materials by Resonant Inelastic X-ray Scattering (RIXS) and X-ray Photoelectron Spectroscopy (XPS) and, in addition, allows for the investigation of liquids encapsulated in a sealed. The instrument is capable of performing angle-resolved XPS measurements allowing to probe the electronic structure of material from surface to bulk. In-house developed software (Centralized Hardware-Overseeing Server, CHaOS and Augmented Data Loading Evaluation Reduction, ADLER) is available to remotely control the experiment and perform a rst-level analysis of the raw data. This allows users to have real-time feedback on the acquired data that is critical for remote-access experiments

Instrument applications
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