Abstract
Phase change optical recording disks using a Pd–Ge–Sb–Te quaternary alloy demonstrated high crystallization speed and long-term thermal stability of the amorphous recording marks. This alloy film can be crystallized by a short duration laser pulse of less than 100 ns. It is applicable to a single beam overwrite optical recording system. The crystallized portion of this recording layer on the disk is assigned to single phase and polycrystalline face-centered-cubic (fcc) crystals by transmission electron diffraction. A small amount of Pd atoms (typically 0.2 to 3 at.%) in this alloy improve the thermal stability of amorphous marks.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
