Abstract
Portable SSD test system inspects SSDs during final semiconductor manufacturing processes. SSD is a next-generation mass storage device. As high protocol speed required, SSD interface is being moved to PCI-Express generation4. In this study, PCI-Express Gen4.0 based Portable Test System was designed. Multiple protocols, such as SATA, SAS, and NVMe test feature is included. The equipment adopt air-cooling system rather than water cooling system for compact design to remove heat that produced during SSD test process. Portable compact design can improve SSD process time.
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