Abstract
We have studied the low-temperature crystallization of (Ba⋅Pb) hexa-ferrite thin films using real time synchrotron X-ray scattering, anomalous X-ray scattering, and vibrating sample magnetometer. The crystallization temperature of amorphous (Ba⋅Pb) hexa-ferrite film (300-A-thick, ∼530∘C) was much lower than that of amorphous Ba hexa-ferrite film, ∼750∘C. The crystalline (Ba⋅Pb) hexa-ferrite phase was formed by solid phase transformation of the interfacial crystalline Fe3O4 phase through the diffusion of Ba or Pb cations. The low crystallization temperature of the (Ba⋅Pb) hexa-ferrite phase was due to the lower diffusion activation barrier of Pb cations than that of Ba cations. The small grain size (∼40 nm in diamter) and comparable magnetic properties (Ms ⊥: 337 emu/cm3, iHc ⊥ : 1.60 kOe) of the crystallized (Ba⋅Pb) hexa-ferrite film also demonstrate its potential possibility for high-density recording media.
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