Patterson analysis for layer profile determination by neutron or X-ray reflectometry

Abstract

The possibility of using Patterson analysis to interpret neutron or X-ray reflectometry data has been critically examined in terms of a hypothetical case study. The technique yields a highly accurate layer profile model provided the data are measured with a beam geometry that gives rise to unit reflectivity atQ= 0 only,i.e.Qc= 0. For those cases where a plateau of unit reflectivity extends out to finiteQ,i.e.Qc> 0, a distorted model is obtained. A strategy to significantly improve this initial estimate of the model is proposed and demonstrated.