Abstract
From the Publisher: Pattern recognition has long been studied in relation to many different (and mainly unrelated) applications, such as remote sensing, computer vision, space research, and medical imaging. In this book Professor Ripley brings together two crucial ideas in pattern recognition; statistical methods and machine learning via neural networks. Unifying principles are brought to the fore, and the author gives an overview of the state of the subject. Many examples are included to illustrate real problems in pattern recognition and how to overcome them.This is a self-contained account, ideal both as an introduction for non-specialists readers, and also as a handbook for the more expert reader.
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