Pattern Classification of Fabric Defects Using a Probabilistic Neural Network and Its Hardware Implementation using the Field Programmable Gate Array System

Abstract

This study proposes a fabric defect classification system using a Probabilistic Neural Network (PNN) and its hardware implementation using a Field Programmable Gate Arrays (FPGA) based system. The PNN classifier achieves an accuracy of 98 ± 2% for the test data set, whereas the FPGA based hardware system of the PNN classifier realises about 94±2% testing accuracy. The FPGA system operates as fast as 50.777 MHz, corresponding to a clock period of 19.694 ns.