Abstract
The spatial resolution is a key optical parameter characterizing the performance of an imaging microscope. Zone plate based x-ray microscopy offers the highest spatial resolution over the whole electromagnet wave spectrum. Sub-20 nm resolution have been demonstrated with soft x-rays and sub-60 nm resolution have been obtained with multikeV x-rays using a laboratory source. There are two simple pathways to achieve sub-10 nm resolution x-ray imaging: (1) improving the fabrication technology to produce zone plates with an outermost zone width less than 10 nm and (2) using a higher diffraction order (such as the third diffraction order) of a currently available zone plate.
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