Passive near-field optical scanning imaging based on semiconductor nanowire/tapered microfiber probe

Abstract

<sec>In this paper, we propose a passive near-field scanning imaging system by using the structure of cadmium sulfide (CdS) nanowire/tapered microfiber probe, which combines the near-field scanning structure and the nanowire/microfiber coupling technology. In the passive near-field scanning imaging system, a passive nanoprobe is adopted to detect the intensity change of the reflected light field on the sample surface, which not only retains the advantage of the nanoprobe for the strong restriction of the reflected light on the sample surface, but also reduces the interference of strong excitation light during detection. Through the high efficiently evanescent field coupling between the CdS nanowire and the tapered microfiber, the collected light signal is transmitted to the photodetector in the far field, and finally the imaging of the target sample morphology can be realized.</sec><sec>At first, the light field model of the nanowire/tapered microfiber probe structure is verified by the finite element analysis method. The calculated collection efficiency from the sample to the probe is about 4.65‰ and the transmission efficiency from the nanowire to the tapered microfiber is about 74.47%. The collection efficiency is improved by an order of magnitude compared with traditional metal-coated near-field probe. In the experiments, a scanning step of 20 nm and a probe-sample distance of 230 nm are selected. The nanowire/tapered microfiber probe and traditional tapered fiber probe are both used to measure the widths of different CdSe nanoribbons samples, and the atomic force microscopy measurement is used as the benchmark to calculate their measurement error, which is increased about 3 times. By changing the angle <i>θ</i> between the probe and the sample, it is found that the resolution obtained using the designed nanowire/microfiber probe is always higher than only using the tapered microfiber probe. Comparing with the tapered microfiber probe scheme, the measurement error is reduced to a value less than 7.2%.</sec><sec>In addition, compared with the active luminescence probe scheme, this passive near-field scanning scheme reduces the preparation complexity of the optical probe and the detection structure complexity of the optical system. The large microscopic illumination area can avoid the influence of the small laser spot size on imaging, and the imaging range is determined only by the travel distance of the linear stage. Therefore, our work may provide an attractive approach for developing new near-field scanning microscopy systems in the future.</sec>