Abstract

A large variation in part size across the projection area of the microscale selective laser sintering process is caused by non-uniform intensity projected onto the substrate by the digital micromirror device (DMD). A corrective gray scale mask with varying intensities was mapped according to a sintered array of parts. The variance in part size across the area was reduced by as much as 45% by using this technique. This approach can be extended to in real-time process control to create a more uniform distribution of heat and in turn better near net shape parts across the projection area.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.