Abstract
Some observations by scanning electron microscopy of gold droplets on gold-chromium duplex films are presented and discussed from the point of view of the reliability of thin-film capacitors prepared from such films. These gross defects result from the ejection of molten droplets from the evaporation source.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
