Abstract
Pure Yttrium silicate (Y2SiO5) crystal was synthesized by solid-state reaction method. The structural behavior of the sample was determined by X-ray diffraction analysis. The particle size of the sample was found around 35 nm. The particle size was further confirmed by transmission electron microscopy (TEM) analysis. The TEM images are well matched with the XRD analysis. The band gap of the Y2SiO5 was determined by Tauc’s plot. The band gap of the sample was obtained 5.44 eV
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