Partially crystallized BaM thin films for high density magnetic recording

Abstract

Partially crystallized Ba-ferrite thin films were prepared by strictly controlling the rapid thermal annealing time during the post-deposition annealing process for as-deposited amorphous thin films. It is believed that by atom force microscopy (AFM) that these kinds of thin films have a smooth surface compared with fully crystallized BaM thin films. Vibrating sample magnetometer (VSM) measurement shows that the films have very small Δ M peak values which correspond to low magnetostatic coupling between the magnetic particles separated by the non-magnetic amorphous phase.