Abstract
Partial detectability profiles are introduced for estimating the fault coverage of random pattern input vectors. Partial profiles are justified mathematically, and the relationship between sample size and error introduced is quantified. The results of circuit simulations are presented, illustrating the accuracy of estimates based on partial detectability profiles. The reason for use of partial profiles instead of full profiles is that they do not require fault simulation over all possible input vectors. Similarly, the advantage partial profiling has over simulating a few random faults for all input vectors is that the number of possible input vectors often becomes prohibitive before the number of faults in very large circuits. Another interesting application is to use partial profiles to determine which faults have the lowest detectabilities. >
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
