Abstract
On-wafer measurements are indispensable for the characterization of electronic devices at millimeter-wave and terahertz frequencies. Recent investigations have demonstrated parasitic effects stemming e.g. from probes, multimode propagation and crosstalk using line standards as devices under test. However, for short-circuited coplanar structures which are often used as reflect standards in on-wafer calibrations, these parasitic effects have not been thoroughly investigated. Therefore, this paper presents a detailed study of parasitic mode effects in conjunction with probe influences occuring in coplanar short measurements.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
