Abstract
We report use of nonlinear tip-sample interactions to parametrically convert the frequency components of periodic tip-sample interaction forces to frequencies where they can be resonantly detected. One flexural mode of a cantilever is used for tapping-mode imaging and another flexural mode is used for detection of forces converted in presence of an externally injected mechanical oscillation at the difference frequency of the detecting mode and a harmonic of the tapping mode. Material contrast in attractive and repulsive regimes are demonstrated on samples with polymethyl methacrylate patterns and with deoxyribonucleic acid strands on silicon.
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