Parametric modeling of the coupling channel of conducted interference based on multi-linear regression model

Abstract

In electromagnetic compatibility testing, the conducted electromagnetic emission (EMI) of the equipment under test (EUT) are required to meet certain standards of electromagnetic compatibility in order to control its external conducted emission. However, sometimes there is no way to eliminate the internal interference sources of EUT, so the only way to reduce the EMI is to change the coupling channel from the internal interference sources to the external test port. Therefore, it is necessary to understand the characteristic of the coupling channel, so that the EMI of the EUT can be effectively analyzed and restrained. In this paper, a frequency-domain parametric modeling method of the coupling channel based on multi-linear regression model is proposed, and an example to verify the algorithm is presented. The example shows that the modeling method can reflect the characteristic of coupling channel in frequency domain.