Abstract
Decomposition methods have been applied to in-plane Mueller matrix ellipsometric scattering data of the Spectralon reflectance standard. Data were measured at the wavelengths 532 nm and 1500 nm, using an achromatic optimal Mueller matrix scatterometer applying a photomultiplier tube and a high gain InGaAs detector for the two wavelengths. A parametric model with physical significance was deduced through analysis of the product decomposed matrices. It is found that when the data are analyzed as a function of the scattering angle, similar to particle scattering, the matrix elements are largely independent of incidence angle. To the first order, we propose that a Guassian lineshape is appropriate to describe the polarization index, while the decomposed diagonal elements of the retardance matrix have a form resembling Rayleigh single scattering. New models are proposed for the off diagonal elements of the measured Mueller matrix.
Highlights
It is important to have a well characterized Mueller matrix of white reflectance standards, such as the Spectralon, in order to obtain correct measurements whenever applying this standard, and in particular, in cases where the polarization of light intervene in the measurement process [1,2,3,4]
Product or polar decomposition allows the decomposition of a Mueller matrix into a product of elementary Mueller matrices, describing depolarization, retardance and diattenuation [13,14,17]
We propose that a simplified parametric model for the Mueller matrix for the Spectralon, can be obtained using polar product decomposition
Summary
It is important to have a well characterized Mueller matrix of white reflectance standards, such as the Spectralon, in order to obtain correct measurements whenever applying this standard, and in particular, in cases where the polarization of light intervene in the measurement process [1,2,3,4]. The Spectralon is the commercial product closest to a Lambertian surface, and is a white diffuse material (based on polytetrafluoroethylene) with excellent reflection properties, produced by Labsphere, USA It is formed as a thermoplastic resin by heat and pressure treatment. It is further fundamentally interesting to understand how a scattering Mueller matrix from a strongly diffuse medium may be interpreted It concerns both the interpretation of Mueller matrices resulting from rough surfaces [5,6,7], powder samples, or extremely diffuse materials such as the Spectralon [2], and the important related problem of Mueller matrices resulting from biological tissue, which has recently regained considerable interest [8,9,10,11,12]. The parametric model was found by studying the data as a function of the Rayleigh scattering angle used in particle scattering experiments, and by using the basis functions revealed from the decomposition
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