Abstract
Here, we perform a theoretical investigation of the impact of film thickness and incident angle on the surface plasmon resonance spectra for annealed and postannealed Ga-doped ZnO (ZnO:Ga) in a 3-phase Kretschmann configuration. A detailed comparative study has been performed to determine the optimum configuration to be utilized for sensing applications. Though both films are found to support plasmonic excitation for thickness below 200 nm, detection accuracy and sensitivity calculations from the resonance plots simulated in the MATLAB environment reveal that the preference of one over the other should be in accordance with the concerned application.
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