Parametric Empirical Bayes Test and Its Application to Selection of Wavelet Threshold

Abstract

In this article, we propose a new method for selecting level dependent threshold in wavelet shrinkage using the empirical Bayes framework. We employ both Bayesian and frequentist testing hypothesis instead of point estimation method. The best test yields the best prior and hence the more appropriate wavelet thresholds. The standard model functions are used to illustrate the performance of the proposed method and make comparisons with other traditional methods.