Parameters of tip–sample interactions in shear mode using a quartz tuning fork AFM with controllable Q-factor

Abstract

A quartz tuning fork-based atomic force microscopy for investigating the tip–sample interactions at the nanoscale in the shear-force mode is described. Results of force interactions (damping and elastic forces) can be obtained from the amplitude-phase-distance spectroscopy measurements made with a tuning fork with a tungsten tip and a sample surface. The influence of the interaction between tip and sample using the quality factor as an indicator is investigated. Furthermore, a simple model shows that the extension of a tuning fork-based AFM can be applied to quantitative analysis of the properties of the sample surface.