Abstract
A computer model of the field-enhanced motion of impurity particles has been developed by some of the authors. It requires as input data some parameters, relevant essentially to the contact phase, in which the charge exchange between particle and electrode takes place. The parameters are to be identified experimentally, by means of various techniques, such as high-speed movies and electrical measurements of various kinds. To facilitate the parameter identification, an advanced data acquisition system, allowing an automatic analysis of film frames obtained by high-speed movies of impurity particle motion, has been devised and built. In the paper, the procedures for frame analysis are described and the data obtained are reviewed, compared with previous results, and discussed.
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